• Field Emission Scanning Electron Microscopy: Zeiss Supra 40 VP (Peltier Stage, SE, BSD, In-Lens, and STEM detectors; EDS, Alicona MeX 3D metrology software)

  • Ion Beam Sputter Coater: IBSE (Ir, C, Pt-Pd, Au)

  • Optical Microscopy: Zeiss, Leica

  • Microtomes