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Field Emission Scanning Electron Microscopy: Zeiss Supra 40 VP (Peltier Stage, SE, BSD, In-Lens, and STEM detectors; EDS, Alicona MeX 3D metrology software)
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Ion Beam Sputter Coater: IBSE (Ir, C, Pt-Pd, Au)
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Optical Microscopy: Zeiss, Leica
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Microtomes


